| 摘要 |
An apparatus for changing an orientation of a semiconductor device in a semiconductor test handler is provided to simplify a testing process by rotating the semiconductor device by 90 degrees, even when a lead arrangement direction is aligned in a horizontal direction. An apparatus for changing an orientation of a semiconductor device in a semiconductor test handler includes a base(110), a rotating member(120), and a driving unit(130). The base is implemented on a handler body. The rotating member is rotatably implemented around a vertical axis of the base. A mount member, on which the semiconductor device is arranged, is formed on an upper surface of the rotating member. The driving unit rotates the rotating member by 90 degrees. The rotating member includes a rotation shaft(121) and a mounting block(123). The rotation shaft is rotatably implemented on the base. The mounting block is coupled with an upper portion of the rotation shaft. A mounting unit is formed on an upper surface of the mounting block.
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