MICROSCOPE SYSTEM FOR TESTING SEMICONDUCTORS,申请号EP20060719077-传众专利搜索

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发明名称	MICROSCOPE SYSTEM FOR TESTING SEMICONDUCTORS
摘要
申请公布号	EP1849038(A2)	申请公布日期	2007.10.31
申请号	EP20060719077	申请日期	2006.01.19
申请人	CASCADE MICROTECH, INC.	发明人	ANDREWS, PETER;HESS, DAVID;NEW, ROBERT
分类号	G03B17/48	主分类号	G03B17/48
代理机构		代理人
主权项
地址

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