发明名称 PHASE CHANGE RANDOM ACCESS MEMORY CELL AND METHOD OF MANUFACTURING THE SAME
摘要 <p>A phase change random access memory cell and a method for manufacturing the same are provided to maintain a stable state of information stored therein by separating a phase change material such as GeSbTe by using an insulating material such as SiOx. A phase change random access memory cell includes a lower electrode, a phase change layer mixed with a phase change material on the lower electrode, and an upper electrode formed on the phase change layer. The phase change material is separated into a constant size by using the phase change material. The phase change material of the phase change layer is formed of a chalcogenide material of one element which is selected from a group including Te, Se, Ge, Sb, Bi, Pb, Sn, As, S, Si, P, and O.</p>
申请公布号 KR20070105752(A) 申请公布日期 2007.10.31
申请号 KR20060038310 申请日期 2006.04.27
申请人 SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION 发明人 LEE, TAE YON;KIM, KI BUM;LEE, DONG BOK;AHN, DONG HO
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址