发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of improving static breakdown voltage. SOLUTION: The semiconductor device 10 includes n insulation-separated transistor elements Tr which are sequentially connected in series between a first predetermined potential and a second predetermined potential. A gate terminal G1 of a first-stage transistor element Tr1 serves as an input terminal, gate terminals G2-Gn of transistor elements Tr2-Trn of respective stages except the first-stage transistor element Tr1 are sequentially connected between parallel RC elements connected in series between the first predetermined potential and the second predetermined potential, and an output is extracted from a terminal at the second predetermined potential of the n-stage transistor Trn. The transistor elements Tr are sequentially provided one by one to incorporate a higher- or lower-stage transistor element Tr in each field region F surrounded by a field isolation trench Zf. A potential of each field region F is specified to be of the same potential as that of one of three terminals of the transistor element Tr placed in the field region F. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007281035(A) 申请公布日期 2007.10.25
申请号 JP20060102395 申请日期 2006.04.03
申请人 DENSO CORP 发明人 YAMADA AKIRA;MURAMOTO HIDETOSHI
分类号 H01L29/786;H01L21/76;H01L21/762;H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/08 主分类号 H01L29/786
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