发明名称 METHOD OF MEASURING IMPEDANCE OF ELECTRONIC CIRCUIT
摘要 PROBLEM TO BE SOLVED: To minimize errors, when measuring impedance by the calculation of a parameter S, in a method for detecting the impedance of an electronic circuit, by impressing a measuring frequency f of high-frequency alternating current voltage as a test signal, to the electronic circuit, based on the response of the circuit to the test signal for acquiring therein the parameter S, indicating a value S=(Z-Z<SB>0</SB>)/(Z+Z<SB>0</SB>) with respect to reference impedance Z<SB>0</SB>, using the prescribed reference impedance Z<SB>0</SB>, by using an analyzer, and for finding the impedance Z, based on the parameter S, in the method of measuring the impedance of the electronic circuit. SOLUTION: The problem to be solved in the present invention is solved, by setting the measurement frequency f so as to generate minimum error▵Z with regard to the impedance Z. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007279039(A) 申请公布日期 2007.10.25
申请号 JP20070097538 申请日期 2007.04.03
申请人 SUSS MICROTEC TEST SYSTEMS GMBH 发明人 RUMIANTSEV ANDREJ;KANEV STOJAN
分类号 G01R27/02;G01R27/26;G01R27/28 主分类号 G01R27/02
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