| 摘要 |
PROBLEM TO BE SOLVED: To provide a data processing IC which can perform determination of quality, with high accuracy, without using systems for poor sensing, such as an LSI tester, etc. to the data processing IC of an object of defective detection. SOLUTION: The data processing IC, mounted in a substrate having a self-test functionality at the job which selects one or a plurality of data processing means, and performs the job comprises a test data formation means for forming test data, corresponding to the job and an expectation value corresponding to the test data, an expected value holding means for maintaining the expectation value, and a result comparing means for comparing the test results obtained by processing the test data in the corresponding data processing means to the job with the expected value. COPYRIGHT: (C)2008,JPO&INPIT
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