发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method capable of suppressing a void, while preventing damage on the surface of a semiconductor substrate when an element separation region is finely formed. SOLUTION: The semiconductor device manufacturing method includes: a process for forming an element separation groove 16 on the surface of the semiconductor substrate 11; a process for forming a thermally-oxidized film 17 on the surface of the element separation groove 16; a process for depositing a silicon oxynitride film 18 on the semiconductor substrate 11 via the thermally-oxidized film 17; a process for thermally processing the silicon oxynitride film 18 in an oxidization atmosphere; and a process for etching the upper part of the thermally-oxidized film 17 and the thermally processed silicon oxynitride film 18. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2007281154(A) |
申请公布日期 |
2007.10.25 |
申请号 |
JP20060104860 |
申请日期 |
2006.04.06 |
申请人 |
ELPIDA MEMORY INC |
发明人 |
MATSUDA YO;AISO FUMIKI;HIROTA TOSHIYUKI |
分类号 |
H01L21/76;H01L21/28;H01L21/768;H01L23/522 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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