发明名称 Method for Hard Mask CD Trim
摘要 Broadly speaking, methods and an apparatus are provided for removing an inorganic material from a substrate. More specifically, the methods provide for removing the inorganic material from the substrate through exposure to a high density plasma generated using an inductively coupled etching apparatus. The high density plasma is set and controlled to isotropically contact particular regions of the inorganic material to allow for trimming and control of a critical dimension associated with the inorganic material.
申请公布号 US2007249177(A1) 申请公布日期 2007.10.25
申请号 US20070767339 申请日期 2007.06.22
申请人 LAM RESEARCH CORPORATION 发明人 KOEMTZOPOULOS C. R.;GANGADHARAN SHIBU;LEE CHRIS G.;MILLER ALAN
分类号 H01L21/302;H01L21/3065;H01L23/00 主分类号 H01L21/302
代理机构 代理人
主权项
地址