发明名称 DEVICE, LITHOGRAPHY DEVICE AND MANUFACTURING METHOD OF DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithography device capable of producing an alignment marker on the rear side of a substrate. <P>SOLUTION: The lithography device is provided with an enclosure for forming a closed environment locally on the rear surface of the substrate, a seal for enclosing tightly the closed environment between the enclosure and the substrate, resist supplying systems (12, 13) for supplying resist, developing systems (14, 15) for supplying developer, and etching systems (16, 17) for etching one or a plurality of markers locally or the like. Further, a mask positioning system and an exposure system are provided also. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007281458(A) 申请公布日期 2007.10.25
申请号 JP20070086616 申请日期 2007.03.29
申请人 ASML NETHERLANDS BV 发明人 KRIKHAAR JOHANNES WILHELMUS MARIA;PELLENS RUDY JAN MARIA;MEESTER ARNOUT JOHANNES;VAN ZEIJL HENDRIKUS WILHELMUS
分类号 H01L21/027;G03F9/00 主分类号 H01L21/027
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