发明名称 3-parameter switching technique for use in MRAM memory arrays
摘要 Disclosed herein are various embodiments of a 3-parameter switching technique for MRAM memory cells arranged on an MRAM array. The disclosed technique alters the relationship between the disturbance margin and write margin of MRAM arrays to reduce the overall disturbance for the arrays by either enlarging the write margin with respect to the original disturbance margin or enlarging the disturbance margin in view of the original write margin. In either approach, the disclosed 3-parameter switching technique successfully decreases the inadvertent writing of unselected bits.
申请公布号 US2007247900(A1) 申请公布日期 2007.10.25
申请号 US20060379527 申请日期 2006.04.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN WEN-CHIN;TANG DENNY;CHENG H.C.
分类号 G11C11/14 主分类号 G11C11/14
代理机构 代理人
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