| 摘要 |
<p>A reconfigurable device test system arranged to test a reconfigurable device with a small number of times of loading of configuration data. A reconfigurable device, which can hold a plurality of elements of configuration data and can perform switching us to which configuration to achieve instantaneously, is employed. In other words, one element of transfer configuration data and one or more elements of test configuration data are preloaded in a configuration memory of the reconfigurable device, and test is performed while switching is made between the transfer configuration data and the test configuration data sequentially. Since the same configuration data is not required to be reloaded repeatedly, test can be performed with a smaller number of times of loading than by the prior art.</p> |
