发明名称 |
DETECTION METHOD OF DISLOCATION, MEASURING METHOD OF NUMBER OF DISLOCATION, MEASURING METHOD OF DISLOCATION DENSITY, AND CALCULATION METHOD OF GAN CRYSTAL SUBSTRATE AND DISLOCATION DENSITY |
摘要 |
PROBLEM TO BE SOLVED: To provide a detection method capable of measuring accurate dislocation density even if the off angle to the (0001) face at the top-surface of a GaN crystal substrate is larger than 0.5°, a measuring method of the number of dislocation and dislocation density using the detection method, and a calculation method of the GaN crystal substrate of which dislocation density is measured by the measuring method of dislocation density and dislocation density. SOLUTION: This detection method of dislocation contains a process in which the off angle to the (0001) face at the top-surface of a GaN crystal substrate is reduced to not greater than 0.5°and a process in which the top-surface of the GaN crystal substrate is etched by an etching liquid. This measuring method of the number of dislocation and dislocation density uses the detection method, and a calculation method of the GaN crystal substrate of which dislocation density is measured by the measuring method of dislocation density and dislocation density is also provided. COPYRIGHT: (C)2008,JPO&INPIT
|
申请公布号 |
JP2007277053(A) |
申请公布日期 |
2007.10.25 |
申请号 |
JP20060106532 |
申请日期 |
2006.04.07 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
OKUI MANABU;FUJIWARA SHINSUKE;NAKAHATA HIDEAKI |
分类号 |
C30B29/38;C30B33/10 |
主分类号 |
C30B29/38 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|