发明名称 Method of fabricating a recess channel transistor
摘要 A method of fabricating a recess channel transistor is provided. First, a hard mask is formed on a doped-semiconductor layer and a substrate. The doped-semiconductor layer and the substrate are etched to form a trench and define a source/drain in the doped-semiconductor layer. An implantation process is performed with a tilt angle on sidewalls of the trench to form an implant area. A thermal oxidation process is performed to form an oxide layer. The oxide layer comprises a first thickness on the source/drain in the sidewalls of the trench and a second thickness on the other portion in the sidewalls of the trench.
申请公布号 US2007249123(A1) 申请公布日期 2007.10.25
申请号 US20060491137 申请日期 2006.07.24
申请人 PROMOS TECHNOLOGIES INC. 发明人 CHOU JIH-WEN;CHU CHIH-HSUN;SHU HSIU-CHUAN
分类号 H01L21/336;H01L21/3205;H01L21/425 主分类号 H01L21/336
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