发明名称 CRYSTALLIZATION METHOD, THIN-FILM TRANSISTOR, METHOD OF MANUFACTURING THE SAME, DISPLAY DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a crystallization method, a method of manufacturing a thin-film transistor, the thin-film transistor, a display device, and a semiconductor device in which a TFT can be obtained with higher mobility and less unevenness in the mobility and threshold voltage property. SOLUTION: In the crystallization by irradiating a non-single semiconductor thin film of 40 to 100 nm provided on an insulation substrate with a laser light; a light intensity distribution having an inverse peak pattern is formed on the surface of the substrate, a light intensity gradient of the light intensity distribution is controlled, a crystal grain array is formed in which a crystal grain 4 is aligned having a longer shape in a crystal growth direction than in a widthwise direction and having a preferential crystal orientation (100) in a grain length direction, and the TFT is formed in which a source region and a drain region are formed so that current flows across a plurality of crystal grains of the crystal grain array in the crystal growth direction. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007281444(A) 申请公布日期 2007.10.25
申请号 JP20070065480 申请日期 2007.03.14
申请人 ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD 发明人 KATO TOMOYA;MATSUMURA MASAKIYO
分类号 H01L21/20;G02F1/1345;G02F1/1368;H01L21/268;H01L21/336;H01L29/786 主分类号 H01L21/20
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