发明名称 |
A METHOD FOR REPAIRING PHOTOMASK |
摘要 |
A method for repairing a photomask is provided to allow the defect parts to be removed at a time and to be repaired at a time, thereby reducing the repairing time. A method for repairing a photomask comprises the steps of forming a first photoresist(30) on a light transparent part(21) and a light nontransparent part(23) of a photomask; exposing the first photoresist so as to allow the part where additional pattern(25) is inserted to be exposed and developing it to form a space part; forming a repair material layer(50) on the space part and the first photoresist; and removing the photoresist and the repair material layer formed on the first photoresist by lift-off method.
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申请公布号 |
KR20070103847(A) |
申请公布日期 |
2007.10.25 |
申请号 |
KR20060035696 |
申请日期 |
2006.04.20 |
申请人 |
LG MICRON LTD. |
发明人 |
PARK, JAE WOO;KANG, KAP SEOK |
分类号 |
G03F1/72;G03F1/48 |
主分类号 |
G03F1/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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