发明名称 A METHOD FOR REPAIRING PHOTOMASK
摘要 A method for repairing a photomask is provided to allow the defect parts to be removed at a time and to be repaired at a time, thereby reducing the repairing time. A method for repairing a photomask comprises the steps of forming a first photoresist(30) on a light transparent part(21) and a light nontransparent part(23) of a photomask; exposing the first photoresist so as to allow the part where additional pattern(25) is inserted to be exposed and developing it to form a space part; forming a repair material layer(50) on the space part and the first photoresist; and removing the photoresist and the repair material layer formed on the first photoresist by lift-off method.
申请公布号 KR20070103847(A) 申请公布日期 2007.10.25
申请号 KR20060035696 申请日期 2006.04.20
申请人 LG MICRON LTD. 发明人 PARK, JAE WOO;KANG, KAP SEOK
分类号 G03F1/72;G03F1/48 主分类号 G03F1/72
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