发明名称 Manufacturing method of semiconductor device
摘要 After an interlayer insulating film and a lower side layer of a conductive film for a bottom electrode and the like are formed above a substrate, a Pt film of a thickness of 50 nm to 500 nm, for example, about 175 nm is formed on the lower side layer as an upper side layer of a conductive film for a bottom electrode by a DC magnetron sputtering method. As the lower side layer, for example, a Ti film is formed. A substrate temperature at a time of forming the upper side layer is set at 250° C. to 450° C., for example, at 350° C. By forming the upper side layer in such a substrate temperature, the upper side layer intense in orientation in a [222] direction is obtained. Therefore, orientation of a ferroelectric film which is formed directly thereon to a [111] direction also becomes extremely favorable.
申请公布号 US2007249065(A1) 申请公布日期 2007.10.25
申请号 US20060510554 申请日期 2006.08.28
申请人 FUJITSU LIMITED 发明人 FUJIKI MITSUSHI
分类号 H01L21/00 主分类号 H01L21/00
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