发明名称 |
RESIN FOR RESIST, POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN |
摘要 |
A positive resist composition which has excellent resolution and a wide focal-depth range; a resin for resists which is for use in the positive resist composition; and a method of forming a resist pattern from the positive resist composition. The resin for resists comprises, as main components, structural units (a) derived from an alpha-(lower alkyl)acrylic ester. The structural units (a) comprise: structural units (a1) derived from an alpha-(lower alkyl) acrylic ester having an acid-dissociable dissolution-inhibitive group; and lactone-containing monocyclic groups. The structural units (a1) comprise structural units represented by the following general formula (a1-1) [wherein R is hydrogen or lower alkyl; and R11 is an acid- dissociable dissolution-inhibitive group which contains a monocyclic aliphatic hydrocarbon group and contains no polycyclic aliphatic hydrocarbon groups].
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申请公布号 |
KR20070103784(A) |
申请公布日期 |
2007.10.24 |
申请号 |
KR20077022028 |
申请日期 |
2007.09.27 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
HAYASHI RYOTARO;HADA HIDEO;IWAI TAKESHI |
分类号 |
G03F7/039;C08F220/18;C08F220/28;H01L21/30 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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