发明名称 RESIN FOR RESIST, POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN
摘要 A positive resist composition which has excellent resolution and a wide focal-depth range; a resin for resists which is for use in the positive resist composition; and a method of forming a resist pattern from the positive resist composition. The resin for resists comprises, as main components, structural units (a) derived from an alpha-(lower alkyl)acrylic ester. The structural units (a) comprise: structural units (a1) derived from an alpha-(lower alkyl) acrylic ester having an acid-dissociable dissolution-inhibitive group; and lactone-containing monocyclic groups. The structural units (a1) comprise structural units represented by the following general formula (a1-1) [wherein R is hydrogen or lower alkyl; and R11 is an acid- dissociable dissolution-inhibitive group which contains a monocyclic aliphatic hydrocarbon group and contains no polycyclic aliphatic hydrocarbon groups].
申请公布号 KR20070103784(A) 申请公布日期 2007.10.24
申请号 KR20077022028 申请日期 2007.09.27
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 HAYASHI RYOTARO;HADA HIDEO;IWAI TAKESHI
分类号 G03F7/039;C08F220/18;C08F220/28;H01L21/30 主分类号 G03F7/039
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