发明名称 CIRCUIT AND A METHOD OF DETERMINING THE RESISTIVE STATE OF A RESISTIVE MEMORY CELL
摘要 A method for determining a resistive state of a resistive memory cell, a memory circuit and a circuit for determining the resistive state of the resistive memory cell are provided to determine the resistive state of the memory cell by comparing a reference current with a current depending on the resistive state of the memory cell. A memory circuit includes a resistive memory cell(105) and at least one reference resistive memory cell(110,115). A read circuit(145) has a first input connected to the resistive memory cell and a second input connected to the reference resistive memory cell. The read circuit further includes an output part delivering an output signal according to the relation between a reference current from the reference resistive memory cell and the resistive state of the memory cell.
申请公布号 KR20070103691(A) 申请公布日期 2007.10.24
申请号 KR20070037694 申请日期 2007.04.18
申请人 QIMONDA AG 发明人 EGERER JENS CHRISTOPH
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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