发明名称 Exposure system and pattern formation method
摘要 <p>An exposure system includes an exposure section (50) provided within a chamber (30) for irradiating a resist film formed on a wafer (40) with exposing light through a mask (41) with an immersion liquid (42) provided on the resist film. It further includes a drying section (54) for drying the surface of the resist film after the irradiation.</p>
申请公布号 EP1632813(A3) 申请公布日期 2007.10.24
申请号 EP20050018106 申请日期 2005.08.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD 发明人 ENDO, MASAYUKI;SASAGO, MASARU
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址
您可能感兴趣的专利