发明名称 Micromachined double tuning-fork gyrometer with detection in the plane of the machined wafer
摘要 The invention relates to a gyrometer based on a vibrating structure, produced by micromachining in a thin planar wafer. It comprises four moving assemblies placed at the vertices of a virtual rectangle, each moving assembly being coupled to two moving assemblies located at neighboring vertices via a coupling structure and comprising an inertial first moving element connected to the coupling structure and intended to vibrate in two orthogonal directions in the plane of the wafer, namely an excitation direction and a detection direction, and a second moving element intended to vibrate in the detection direction and connected, on one side, to the first moving element and, on the other side, to anchoring zones via linking means.
申请公布号 US7284429(B2) 申请公布日期 2007.10.23
申请号 US20040929398 申请日期 2004.08.31
申请人 CHAUMET BERNARD;LEVERRIER BERTRAND;ROUGEOT CLAUDE 发明人 CHAUMET BERNARD;LEVERRIER BERTRAND;ROUGEOT CLAUDE
分类号 G01C19/00;G01C19/56;G01C19/5747;G01P3/44;G01P9/00;G01P15/08 主分类号 G01C19/00
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