发明名称 Etching method
摘要 An etching method etches an organic film by using an inorganic film as a mask at a high etch rate, in a satisfactory etch profile in a satisfactory in-plane uniformity without causing the inorganic film to peel off. An organic film formed on a workpiece is etched by using an inorganic film as a mask with a plasma produced by discharging an etching gas in a processing vessel ( 1 ). The etching method uses a mixed gas containing NH<SUB>3 </SUB>gas and O<SUB>2 </SUB>gas for etching the organic film when the organic film is to be etched in a pattern having an opening ratio of 40% or above. The etching method uses NH<SUB>3 </SUB>gas as an etching gas for etching the organic film when the organic film is to be etched in a pattern having an opening ratio below 40%.
申请公布号 US7285498(B2) 申请公布日期 2007.10.23
申请号 US20040956365 申请日期 2004.10.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OGAWA KAZUTO;INAZAWA, LEGAL REPRESENTATIVE RIE;HAYASHI HISATAKA;OHIWA TOKUHISA
分类号 H01L21/3065;H01L21/461;H01L21/302;H01L21/311 主分类号 H01L21/3065
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