发明名称 |
Etching method |
摘要 |
An etching method etches an organic film by using an inorganic film as a mask at a high etch rate, in a satisfactory etch profile in a satisfactory in-plane uniformity without causing the inorganic film to peel off. An organic film formed on a workpiece is etched by using an inorganic film as a mask with a plasma produced by discharging an etching gas in a processing vessel ( 1 ). The etching method uses a mixed gas containing NH<SUB>3 </SUB>gas and O<SUB>2 </SUB>gas for etching the organic film when the organic film is to be etched in a pattern having an opening ratio of 40% or above. The etching method uses NH<SUB>3 </SUB>gas as an etching gas for etching the organic film when the organic film is to be etched in a pattern having an opening ratio below 40%.
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申请公布号 |
US7285498(B2) |
申请公布日期 |
2007.10.23 |
申请号 |
US20040956365 |
申请日期 |
2004.10.04 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
OGAWA KAZUTO;INAZAWA, LEGAL REPRESENTATIVE RIE;HAYASHI HISATAKA;OHIWA TOKUHISA |
分类号 |
H01L21/3065;H01L21/461;H01L21/302;H01L21/311 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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