发明名称 Semiconductor device and method for manufacturing multilayered substrate for semiconductor device
摘要 A method for manufacturing a multilayered substrate for a semiconductor device, as well as a semiconductor device, is provided, the multilayered substrate exhibiting an excellent thermal conduction property and an excellent heat spreading effect without occurrence of warp and deformation. A diamond layer is formed through vapor phase deposition on one principal surface of a first silicon substrate by a CVD method. A SiO<SUB>2 </SUB>layer is formed on this diamond layer. A SiO<SUB>2 </SUB>layer is formed on a surface of a second silicon substrate by a thermal oxidation method. The diamond layer is bonded to the second silicon substrate with SiO<SUB>2 </SUB>layers disposed on both the diamond layer and the second silicon substrate therebetween. The first silicon substrate is removed by dissolution through etching to expose the surface of the diamond layer. A silicon layer serving as a semiconductor layer is formed on the diamond layer by a CVD method.
申请公布号 US7285479(B2) 申请公布日期 2007.10.23
申请号 US20060328162 申请日期 2006.01.10
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO 发明人 TACHIBANA TAKESHI;HAYASHI KAZUSHI;YOKOTA YOSHIHIRO;KOBASHI KOJI;KOBORI TAKASHI
分类号 H01L21/78;H01L21/301;H01L21/46 主分类号 H01L21/78
代理机构 代理人
主权项
地址