发明名称 |
Chemical vapor deposition of high conductivity, adherent thin films of ruthenium |
摘要 |
A multi-step method for depositing ruthenium thin films having high conductivity and superior adherence to the substrate is described. The method includes the deposition of a ruthenium nucleation layer followed by the deposition of a highly conductive ruthenium upper layer. Both layers are deposited using chemical vapor deposition (CVD) employing low deposition rates.
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申请公布号 |
US7285308(B2) |
申请公布日期 |
2007.10.23 |
申请号 |
US20040803750 |
申请日期 |
2004.03.18 |
申请人 |
ADVANCED TECHNOLOGY MATERIALS, INC. |
发明人 |
HENDRIX BRYAN C.;WELCH JAMES J.;BILODEAU STEVEN M.;ROEDER JEFFREY F.;XU CHONGYING;BAUM THOMAS H. |
分类号 |
C23C16/00;C23C16/02;C23C16/16;C23C16/18;C23C16/44;C23C16/455 |
主分类号 |
C23C16/00 |
代理机构 |
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