发明名称 Chemical vapor deposition of high conductivity, adherent thin films of ruthenium
摘要 A multi-step method for depositing ruthenium thin films having high conductivity and superior adherence to the substrate is described. The method includes the deposition of a ruthenium nucleation layer followed by the deposition of a highly conductive ruthenium upper layer. Both layers are deposited using chemical vapor deposition (CVD) employing low deposition rates.
申请公布号 US7285308(B2) 申请公布日期 2007.10.23
申请号 US20040803750 申请日期 2004.03.18
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 HENDRIX BRYAN C.;WELCH JAMES J.;BILODEAU STEVEN M.;ROEDER JEFFREY F.;XU CHONGYING;BAUM THOMAS H.
分类号 C23C16/00;C23C16/02;C23C16/16;C23C16/18;C23C16/44;C23C16/455 主分类号 C23C16/00
代理机构 代理人
主权项
地址