发明名称 Techniques for monitoring and replacing circuits to maintain high performance
摘要 Techniques are provided for monitoring the performance of circuits and replacing low performing circuits with higher performing circuits. A frequency detector compares the frequency of a first periodic signal to the frequency of a second periodic signal. The difference in the frequency between the first periodic signal and the second periodic signal indirectly indicates how much the threshold voltages of the transistors have shifted. The difference in frequency between the two periodic signals can be monitored to determine the speed and performance of circuits on the chip. The output of the frequency detector can also indicate when to replace low performing circuits with higher performing circuits. When the frequency of the second periodic signal differs from the frequency of the first periodic signal by a predefined percentage, a low performing circuit is replaced with a higher performing replica circuit.
申请公布号 US7286020(B1) 申请公布日期 2007.10.23
申请号 US20050231641 申请日期 2005.09.21
申请人 ALTERA CORPORATION 发明人 O HUGH SUNGKI;SENGUPTA SAMIT;INGINO, JR. JOSEPH MICHAEL
分类号 G01R31/00;G01R23/00;G06F11/16;H03K19/003 主分类号 G01R31/00
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