| 摘要 |
A flexible serve straight vertical probe card is provided to minimize the damage of a TAP(Tape Automated Bonding) product by adjusting the contact pressure of a probe through the adjustment of a bending angle. A flexible serve straight vertical probe card includes a probe(37) which is vertically contacted to an electrode pad of a TAP product such as a TCP(Tape Carrier Package) and a COF(Chip On Flexible board), and tests the short or open of a TAP circuit. The probe(37) is divided into an upper vertical unit, a middle bending unit, and a lower vertical unit by doubly bending a fine wire. The upper vertical unit is electrically connected to a driving IC(Integrated Circuit) to support an upper probe block(33), and the lower vertical unit supports a lower probe block(36). |
