发明名称 NONVOLATILE MEMORY ELEMENT AND ITS MANUFACTURING METHOD
摘要 <p>A nonvolatile memory element comprises a first electrode (2), a second electrode (6) formed above the first electrode (2), a variable resistive film (4) which is formed between the first electrode (2) and the second electrode (6) and whose resistance value is increased or decreased depending on an electric pulse applied between the electrodes (2, 6), and an interlayer insulating film (3) provided between the first electrode (2) and the second electrode (6). In the interlayer insulating film (3), an opening extending from its surface to the first electrode (2) is formed. The variable resistive film (4) is formed on the inner wall surface of the opening. The inner area of the opening formed by the variable resistive film (4) is filled with an embedded insulating film (5).</p>
申请公布号 WO2007116749(A1) 申请公布日期 2007.10.18
申请号 WO2007JP56424 申请日期 2007.03.27
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;MIKAWA, TAKUMI;TAKAGI, TAKESHI 发明人 MIKAWA, TAKUMI;TAKAGI, TAKESHI
分类号 H01L27/10;H01L27/105;H01L45/00;H01L49/00 主分类号 H01L27/10
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