发明名称 MASK BLANK AND PHOTOMASK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a mask blank suitable to a photomask for FPD, and the photomask. <P>SOLUTION: The mask blank 10 is for manufacturing an FPD device, and has a substrate 12, a light shield film 14 formed on the substrate 12 by using metal silicide as a material, and an upper-layer film 16 formed on the light shield film 14 by using a material containing chromium. The light shield film 14 and upper-layer film 16 are films to be wet-etched by using an etching mask obtained by patterning a resist film 18 formed on the upper-layer film 16, and the resist film 18 is formed by discharging resist liquid onto the upper-layer film 16 from a nozzle having a resist liquid supply hole extending in one direction and also simultaneously moving the nozzle in a direction crossing the one direction relatively to the upper-layer film surface. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007271775(A) 申请公布日期 2007.10.18
申请号 JP20060095313 申请日期 2006.03.30
申请人 HOYA CORP;HOYA ELECTRONICS MALAYSIA SDN BHD 发明人 MITSUI MASARU;ASAKAWA TAKASHI
分类号 G03F1/00;G03F1/46;G03F1/50;G03F1/54 主分类号 G03F1/00
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