发明名称 Semiconductor integrated circuit device and method of testing the same
摘要 A semiconductor integrated circuit device includes a control circuit configured to generate a control code to control a parameter of a predetermined circuit and outputs the control code to the predetermined circuit; and a latch circuit connected with an output of the control circuit to latch the control code in response to a control signal. The latch circuit may be provided between the control circuit and the predetermined circuit to latch the control code or transfer the control code to the predetermined circuit, in response to the control signal.
申请公布号 US2007245186(A1) 申请公布日期 2007.10.18
申请号 US20070727452 申请日期 2007.03.27
申请人 ELPIDA MEMORY, INC. 发明人 ABE TSUNEO
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址