发明名称 Mechanical quantity measuring apparatus
摘要 It is an object to prevent breakage of a mechanical quantity measuring apparatus made of a monocrystalline silicon substrate due to a large distortion. A mounting board for measuring distortion is provided on a rear surface of a sensor chip made of a semiconductor monocrystalline substrate having a distortion detecting unit. Even when a large distortion occurs in an object to be measured, a distortion occurring in the semiconductor monocrystalline substrate can be controlled by the mounting board. Therefore, the semiconductor monocrystalline substrate is not broken, and a highly reliable mechanical quantity measuring apparatus can be provided.
申请公布号 US2007240519(A1) 申请公布日期 2007.10.18
申请号 US20070698584 申请日期 2007.01.25
申请人 HITACHI, LTD. 发明人 SHIMAZU HIROMI;OHTA HIROYUKI
分类号 G01B7/16 主分类号 G01B7/16
代理机构 代理人
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