发明名称 SEMICONDUCTOR MEMORY DEVICE WITH TEMPERATURE SENSING DEVICE
摘要 A semiconductor memory device with a temperature sensing device is provided to measure temperature without noise condition, and to perform stable refresh by receiving a temperature value without an error. A semiconductor memory device comprises a temperature sensing unit(300A) for sensing present temperature in response to a control signal, and enters a mode without actual power consumption for a constant time from the enabling of the control signal. The mode without actual power consumption is an idle state or a power down mode. The control signal performs a driving for impedance matching of an ODT(On Die Termination) or OCD(Off Chip Driver) driver. The temperature sensing unit comprises a sensing part(330) for sensing present temperature in response to the control signal, an analog-digital conversion part(340) for converting an analog-output value of the sensing part into a digital level, and a register(350) for outputting a temperature value by storing the output value of the analog-digital conversion part.
申请公布号 KR20070102074(A) 申请公布日期 2007.10.18
申请号 KR20060033729 申请日期 2006.04.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, KYUNG HOON;PATRICK B. MORAN
分类号 G11C11/406;G11C11/4078 主分类号 G11C11/406
代理机构 代理人
主权项
地址