发明名称 METHOD OF CONCURRENTLY PATTERNING A SUBSTRATE HAVING A PLURALITY OF FIELDS AND ALIGNMENT MARKS
摘要 <p>A method of patterning a substrate comprising first and second fields with a template, the template having a mold and a plurality of alignment forming areas and a plurality of template alignment marks, the method comprising: positioning a material on the first field of the substrate and a plurality of regions of the substrate, the plurality of regions laying outside of the first and second fields; positioning the mold and the substrate such that a desired spatial relationship between the mold and the first field of the substrate is obtained to define a pattern in the material on the first field of the substrate while concurrently defining a plurality of substrate alignment marks with the material in the plurality of regions of the substrate in superimposition with the plurality of alignment forming areas of the template; positioning a material on the second field of the substrate; and positioning the mold and the substrate to obtain a desired spatial relationship between the plurality of template alignment marks and the plurality of substrate alignment marks such that a desired spatial relationship between the mold and the second field of the substrate is obtained to define a pattern in the material on the second field of the substrate.</p>
申请公布号 WO2007117524(A2) 申请公布日期 2007.10.18
申请号 WO2007US08434 申请日期 2007.04.03
申请人 MOLECULAR IMPRINTS, INC. 发明人 SREENIVASAN, SIDLGATA V.;MCMACKIN, IAN M.;CHOI, BYUNG-JIN;MELLIAR-SMITH, CHRISTOPHER M.
分类号 B29C43/02 主分类号 B29C43/02
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