发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has high resistance to a surge voltage, and is small in size and inexpensive. SOLUTION: The semiconductor device 100 is equipped with gate wiring, which is connected to the gate electrodes of transistor cells TC formed on a semiconductor substrate 1 and formed as a plane gate wiring layer GH that is linked in a two-dimensional manner covering the transistor cells TC through a first interlayer insulating film Z1, and drain wiring which is connected to the drains of the transistor cells TC and formed as a plane drain wiring layer DH that is linked in a two-dimensional manner confronting the gate wiring layer GH through a second interlayer insulating film Z2. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007273689(A) 申请公布日期 2007.10.18
申请号 JP20060096851 申请日期 2006.03.31
申请人 DENSO CORP 发明人 AKAGI NOZOMI;KONO KENJI;BAN HIROYUKI
分类号 H01L21/8234;H01L21/3205;H01L21/82;H01L21/822;H01L23/52;H01L27/04;H01L27/088;H01L29/78 主分类号 H01L21/8234
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