发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To inhibit a reaction product from being deposited in a gap between a wafer stage and a focus ring when treating a substrate to be treated utilizing plasma discharge. SOLUTION: The semiconductor manufacturing apparatus is equipped with a chamber 1 capable of keeping a predetermined vacuum level, a wafer stage 3 supporting the substrate 2 to be treated in the chamber, a focus ring 5 arranged around the wafer stage, and a holding bed 6 keeping the wafer stage and the focus ring, and carries out the treatment for the substrate to be treated located on the wafer stage utilizing plasma discharge generated in the chamber. The holding bed has a gas discharge hole 9 which makes the gap between the wafer stage and focus ring communicate with the outside of the chamber and can discharge the reaction product 8 existing in the gap through the gas discharge hole to the outside of the chamber. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007273824(A) 申请公布日期 2007.10.18
申请号 JP20060098965 申请日期 2006.03.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMASHITA TAKESHI
分类号 H01L21/3065;C23C16/44;C23C16/458;C23C16/509 主分类号 H01L21/3065
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