发明名称 Semiconductor device including nonvolatile memory and method for fabricating the same
摘要 A semiconductor device including a nonvolatile memory and the fabrication method of the same is described formed on a semiconductor substrate. According to the semiconductor device, a second gate electrode film is used for a gate electrode film of a logic circuit, and for a control gate electrode film of a nonvolatile memory. As the second gate electrode film is formed at a relatively later step in fabrication, subsequent thermal process may be avoided. The gate structure is suitable for miniaturization of the transistor in the logic circuit.
申请公布号 US7282413(B2) 申请公布日期 2007.10.16
申请号 US20050318501 申请日期 2005.12.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAKEBUCHI MASATAKA;ARAI FUMITAKA
分类号 H01L21/8234;H01L21/8247;H01L27/088;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8234
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