发明名称 |
ACID AMPLIFIER AND CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION INCLUDING THE SAME |
摘要 |
<p>An acid amplifier, a photoresist composition containing the acid amplifier, and a method for forming a photoresist pattern by using the composition are provided to improve the sensitivity of chemically amplified resist, the contract of exposure part and nonexposure part and the adhesive strength to a substrate. An acid amplifier is represented by the formula 1, wherein R1 is a C1-C3 alkyl group, a fluoroalkyl group, a C6-C10 aryl group, or an alkylaryl group; and R2 is a substituted or unsubstituted C1-C30 alkyl, cycloalkyl, aryl or arylalkyl group containing a hydroxyl group. The photoresist composition comprises 0.05-20 wt% of the acid amplifier; 1-30 wt% of an acid labile photosensitive polymer; 0.05-20 parts by weight of a photoacid generator based on 100 parts by weight of the photosensitive polymer; and the balance of an organic solvent.</p> |
申请公布号 |
KR20070101004(A) |
申请公布日期 |
2007.10.16 |
申请号 |
KR20060032215 |
申请日期 |
2006.04.10 |
申请人 |
DONGJIN SEMICHEM CO., LTD. |
发明人 |
SON, EUN KYUNG;PARK, MYOUNG HWAN;LEE, JAE WOO;KIM, JAE HYUN |
分类号 |
C07C309/68;C07C309/65;G03F7/004 |
主分类号 |
C07C309/68 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|