发明名称 METHOD OF FORMING A FIN FIELD EFFECT TRANSISTOR
摘要 A method of forming a fin field effect transistor is provided to improve the current driving capabilities of an NMOS field effect transistor and a PMOS field effect transistor independent of each other. A method of forming a fin field effect transistor includes the steps of: forming an active pin(102) on a semiconductor substrate(100); forming a gate crossing the active pin(102); forming a spacer(108) and a stress generation pattern(110) on both side surfaces of the gate and both side surfaces of the active pin(102); and forming a source/drain by injecting impurities below the surface of the active pin(102).
申请公布号 KR20070101058(A) 申请公布日期 2007.10.16
申请号 KR20060032355 申请日期 2006.04.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SUNG MIN
分类号 H01L21/336 主分类号 H01L21/336
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