发明名称 |
METHOD OF FORMING A FIN FIELD EFFECT TRANSISTOR |
摘要 |
A method of forming a fin field effect transistor is provided to improve the current driving capabilities of an NMOS field effect transistor and a PMOS field effect transistor independent of each other. A method of forming a fin field effect transistor includes the steps of: forming an active pin(102) on a semiconductor substrate(100); forming a gate crossing the active pin(102); forming a spacer(108) and a stress generation pattern(110) on both side surfaces of the gate and both side surfaces of the active pin(102); and forming a source/drain by injecting impurities below the surface of the active pin(102).
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申请公布号 |
KR20070101058(A) |
申请公布日期 |
2007.10.16 |
申请号 |
KR20060032355 |
申请日期 |
2006.04.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SUNG MIN |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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