发明名称 |
Built-in self-test circuit for phase locked loops, test method and computer program product therefor |
摘要 |
A built-in self-test circuit for phase locked loops includes a measurement circuit for measuring outputs of the phase locked loops, and receiving as inputs a plurality of external test signals. At least one module includes a scan chain for storing the test signals for programming the phase locked loops and the measurement circuit.
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申请公布号 |
US7284173(B2) |
申请公布日期 |
2007.10.16 |
申请号 |
US20040841981 |
申请日期 |
2004.05.07 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
NAPOLITANO LEONARDO |
分类号 |
G01R31/3187;G01R31/3167;G01R31/3185;H03L7/06 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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