| 摘要 |
An LSI according to the present invention has a scan chain which comprises a plurality of SFFs between a buffer connected to an external pin and an internal circuit. During test mode, a test signal is inputted to the internal circuit of the LSI using the scan chain. In this case, a high-number-pins-test switch signal is inputted to an output buffer of a bidirectional pin of the external pins, set the bidirectional pin to output mode. Also, an output buffer is provided to an input pin, and the high-number-pins-test switch signal set the input pin to the output mode.
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