发明名称 MIM capacitor structure and method of manufacture
摘要 A metal-insulator-metal (MIM) capacitor structure and method of manufacturing thereof. A plurality of MIM capacitor patterns is formed in two or more insulating layers. The insulating layers may comprise a via layer and a metallization layer of a semiconductor device. A top portion of the top insulating layer is recessed in a region between at least two adjacent MIM capacitor patterns. When the top plate material of the MIM capacitors is deposited, the top plate material fills the recessed area of the top insulating layer between the adjacent MIM capacitor pattern, forming a connecting region that couples together the top plates of the adjacent MIM capacitors. A portion of the MIM capacitor bottom electrode may be formed in a first metallization layer of the semiconductor device.
申请公布号 US7282757(B2) 申请公布日期 2007.10.16
申请号 US20030689294 申请日期 2003.10.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TU KUO-CHI;CHEN CHUN-YAO;WUU SHOU-GWO;WANG CHEN-JONG
分类号 H01L27/105;H01L21/02;H01L21/8242 主分类号 H01L27/105
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