发明名称 Process for reducing a size of a compact EEPROM device
摘要 The present invention is a method, and resulting device, for fabricating memory cells with an extremely small area. The small area requirement is met due primarily to two significant factors. First, a judicious use of spacers allows a control gate/wordline or select line to be fabricated in extremely close proximity to an associated plurality of floating gates. Additionally, each of the plurality of floating gates is supplied with a majority carrier (e.g., electrons) through a charge injector. Each of the plurality of injector regions is made by doping a localized area (e.g., through injector ion implantation) creating a subsurface highly-doped region that is setup to receive bias from a nearby contact for charge generation, i.e., a tunneling injector.
申请公布号 US2007235797(A1) 申请公布日期 2007.10.11
申请号 US20060393145 申请日期 2006.03.29
申请人 LOJEK BOHUMIL 发明人 LOJEK BOHUMIL
分类号 H01L29/788;H01L21/336 主分类号 H01L29/788
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