发明名称 Non-volatile memory device and method of manufacturing the same
摘要 A non-volatile memory device and a method of manufacturing the same, in which the program speed can be enhanced and the interference phenomenon can be reduced. The non-volatile memory device includes a semiconductor substrate having an active region defined by isolation layers arranged in one direction, a control gate arranged vertically to the direction in which the isolation layers are arranged, a floating gate formed on the active region below the control gate and having a lateral curve so that the floating gate has a width narrowed upwardly, a gate insulating layer formed between the floating gate and the semiconductor substrate, and a dielectric layer formed between the floating gate and the control gate.
申请公布号 US2007235800(A1) 申请公布日期 2007.10.11
申请号 US20060634622 申请日期 2006.12.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN JUNG RYUL;KIM JUM SOO
分类号 H01L29/788 主分类号 H01L29/788
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