发明名称 METHOD OF FORMING DUAL DAMASCENE SEMICONDUCTOR DEVICE
摘要 A method of forming a dual damascene includes forming first, second and third material layers sequentially over a substrate. The first, second and third material layers have first, second and third thicknesses, respectively. An opening is etched within the first material layer while a portion or all of the thickness of the third layer is simultaneously removed. The ratio of the depth of the opening and the thickness of the third material layer removed, correspond to an etch selectivity of the first material layer and the second material layer. The etching operation may be automatically terminated to produce the opening with a predetermined depth.
申请公布号 US2007238306(A1) 申请公布日期 2007.10.11
申请号 US20060279055 申请日期 2006.04.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN CHIH-HAN;CHEN KUN-EI
分类号 H01L21/467 主分类号 H01L21/467
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