发明名称 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE HAVING A SILICON OXYNITRIDE FILM
摘要 A semiconductor device manufacturing method includes: a process of forming an isolation trench on the surface of a semiconductor substrate; a process of forming a thermally-oxidized film on the surface of the isolation trench; a process of depositing a silicon oxynitride film on the semiconductor substrate via the thermally-oxidized film; a process of heat-treating the silicon oxynitride film in an oxidizing atmosphere; and a process of etching the top of the thermally-oxidized film and the heat-treated silicon oxynitride film.
申请公布号 US2007238310(A1) 申请公布日期 2007.10.11
申请号 US20070697082 申请日期 2007.04.05
申请人 ELPIDA MEMORY, INC. 发明人 MATSUDA YO;AISO FUMIKI;HIROTA TOSHIYUKI
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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