发明名称 Phase change memory device employing thermally insulating voids and sloped trench, and a method of making same
摘要 A phase change memory device, and method of making the same, that includes a trench formed in insulation material having opposing sidewalls that are inwardly sloping with trench depth. A first electrode is formed in the trench. Phase change memory material is formed in electrical contact with the first electrode. A second electrode is formed in electrical contact with the phase change memory material. Voids are formed in the insulation material to impede heat from the phase change memory material from conducting away therefrom. The voids are formed in pairs, with either a portion of the phase change memory material or the second electrode disposed between the voids.
申请公布号 US2007236988(A1) 申请公布日期 2007.10.11
申请号 US20070807131 申请日期 2007.05.25
申请人 CHEN BOMY 发明人 CHEN BOMY
分类号 G11C11/00 主分类号 G11C11/00
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