METHOD OF INSPECTING SOLID-STATE IMAGING DEVICE, AND DEVICE THEREFOR

摘要

PROBLEM TO BE SOLVED: To provide a device for inspecting a solid-state imaging device which can inspect a large number of solid-state imaging devices consecutively with a frame memory and a video memory of small capacities only by loading one of a strobe pattern. SOLUTION: The inspection device performs data sampling of an image signal string outputted from the solid-state imaging device 1 with the strobe pattern to inspect the solid-state imaging device. The device is provided with a storage means 22 which holds the strobe pattern for performing data sampling while thinning the image signal string; and a delay means 21 which performs data sampling of the image signal string with a pattern obtained by deviating the strobe pattern read from the storage means 22 by a predetermined portion with respect to the image signal string. COPYRIGHT: (C)2008,JPO&INPIT