发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce current consumption in a semiconductor memory device during precharging. SOLUTION: During precharging, a precharge potential control circuit 106 applies a low voltage for application equal to or lower than a predetermined first detection potential to a pair of global data lines GDL, GDL when a potential common to the pair of global data lines GDL, GDL is higher than the first detection potential, applies a high voltage for application equal to or higher than a predetermined second detection potential to the pair of global data lines GDL, GDL when the potential common to the pair of global data lines GDL, GDL is lower than the second detection potential, and applies no voltage when the potential of the pair of global data lines GDL, GDL is equal to or lower than the first detection potential and equal to or higher than the second detection potential. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007265552(A) 申请公布日期 2007.10.11
申请号 JP20060090423 申请日期 2006.03.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ORIGASA KENICHI
分类号 G11C11/4091 主分类号 G11C11/4091
代理机构 代理人
主权项
地址