发明名称 THRESHOLD PERSONALIZATION TESTMODE
摘要 A threshold personalization circuit for a reset or supervisor chip includes personalization fuses, which shift a resistor divider to provide a variety of selectable voltage thresholds. The personalization fuses may provide hundreds of millivolts of adjustment. The threshold personalization circuit further includes trim fuses to fine tune the threshold to within a few millivolts of the target threshold voltage. The threshold personalization circuit includes a test mode to cycle through to a particular personalization trim, such that at prelaser testing the personalized value is found (the fuse blow for personalization is emulated) and then the trim fuse amount can be based on the actual final personalized voltage. This results in very accurate threshold voltages for all personalized values.
申请公布号 US2007236268(A1) 申请公布日期 2007.10.11
申请号 US20070733081 申请日期 2007.04.09
申请人 STMICROELECTRONICS, INC. 发明人 MCCLURE DAVID
分类号 H03K5/13 主分类号 H03K5/13
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