发明名称 SYSTEM AND METHOD TO IMPROVE CHIP YIELD, RELIABILITY AND PERFORMANCE
摘要 Improving semiconductor chip yield and reliability by connecting adjacent metal traces that are on a same network with metal shorts. This reduces and/or eliminates the need for redundant vias formerly employed in semiconductor chip design. Additionally, the metal shorts are placed in conformance with one or more pre-determined design rules. Once placed, the metal shorts are checked to ensure that each metal short connects groundrule clean, thereby ensuring the placement is correct-by-construction.
申请公布号 US2007240084(A1) 申请公布日期 2007.10.11
申请号 US20070763781 申请日期 2007.06.15
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BONGES HENRY A.III
分类号 G06F17/50 主分类号 G06F17/50
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