发明名称 METHOD OF MANUFACTURING SIMOX WAFER
摘要 PROBLEM TO BE SOLVED: To provide an SIMOX (Separation by Implanted Oxygen) wafer in which the roughness of an SOI surface is very excellent. SOLUTION: The SIMOX wafer is manufactured by implanting oxygen ions onto the surface of an Si substrate, and then, performing high-temperature annealing. In this case, at least the atmosphere of the final stage of the high-temperature annealing is made into an atmosphere containing 3-10% oxygen in volume% for Ar or N<SB>2</SB>. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007266101(A) 申请公布日期 2007.10.11
申请号 JP20060086009 申请日期 2006.03.27
申请人 SUMCO CORP 发明人 MURAKAMI YOSHIO;KASAMATSU TAKAAKI;AOKI YOSHIRO
分类号 H01L21/02;H01L21/265;H01L21/324;H01L27/12 主分类号 H01L21/02
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