发明名称 APPARATUS AND METHOD FOR GENERATING TEST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide techniques with which display accuracy of a liquid crystal display device is easily confirmed, thereby shortening the time required for evaluation. SOLUTION: In a test pattern generating apparatus 1 for generating a test pattern to be used for evaluating the image quality of a display 5, based on the resolution of the display 5 or the standard of an input signal to the display 5, a display condition input section 2 sets the output conditions for outputting the test pattern onto the display 5. Associated with the output conditions set by the display condition input section 2, a pattern creation and display processing section 3 plots a graphic on a bit map alternately, by using first and second gradations that differ from each other. The bit map plotted by the pattern creation and display processing section 3 is displayed on the display 5 as test pattern. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007267284(A) 申请公布日期 2007.10.11
申请号 JP20060092515 申请日期 2006.03.29
申请人 FUJITSU LTD 发明人 KATO HIDEO
分类号 H04N17/02;G02F1/13 主分类号 H04N17/02
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